发明名称 TESTING METHOD FOR SEARCHING UNIT PIXEL OF WHICH COLOR DISCRIMINATING CAPABILITY IS DECREASED BY BLOOMING
摘要 PURPOSE: A testing method for searching a unit pixel of which color discriminating capability is decreased by blooming is provided to easily determine whether color discriminating capability is decreased or not with various test patterns using metal shields, thereby reducing the time required for the development of image sensors. CONSTITUTION: A testing method for searching a unit pixel of which color discriminating capability is decreased by blooming includes the steps of forming a first test pattern covering all unit pixels except unit pixels per color to test with a metal shield for measuring intrinsic color values for the unit pixels(100,120,140,160) per color, forming a second test pattern covering the unit pixels to text with a metal shield for measuring color values of the unit pixels to test from the second test pattern, thereby measuring the blooming influence generated by the rest pixels, forming a third test pattern covering all pixels except unit pixels positioned on a diagonal line of the unit pixels to test with a metal shield and measuring the blooming influence generated by the diagonally positioned pixels, forming a fourth test pattern covering all pixels except unit pixels positioned at both right and left sides of the unit pixel to test with a metal shield for measuring the blooming influence generated by the right and left pixels, and comparing the intrinsic color values with the color values measured from the second to fourth steps to determine whether the color discriminating capability of the unit pixels to test is decreased.
申请公布号 KR20030002887(A) 申请公布日期 2003.01.09
申请号 KR20010038716 申请日期 2001.06.30
申请人 HYNIX SEMICONDUCTOR INC. 发明人 CHO, WAN HUI
分类号 H04N5/359;H04N5/357;(IPC1-7):H04N5/335 主分类号 H04N5/359
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