Arrangement for electrically testing and measuring electrical components has conducting flat lamella measurement contact elements movable to measurement position in plane of surfaces

摘要

The arrangement has a measurement circuit with several measurement contact elements movable from initial positions to measurement positions to make contact with the component's (1) contacts. The measurement contact elements (6) are made of an electrically conducting material as flat lamellas and are movable from the initial position to the measurement position in the plane of their surfaces.