发明名称 ADDRESS TRANSITION DETECTING CIRCUIT
摘要 PURPOSE: An address transition detecting circuit(ATD) is provided, which prevents an unnecessary address transition detecting signal from being generated by a glitch generation of an address signal. CONSTITUTION: The first detection unit(202) detects the first transition of an address buffer(201) signal being output by buffering an external address signal. The first control unit(206) controls a current flow of the first detection unit so that an output of the first detection unit has a different phase from the address buffer signal and has the same pulse width as the address buffer signal. The second detection unit(203) detects the second transition of the address buffer signal. The second control unit(207) controls a current flow of the second detection unit so that an output of the second detection unit has a different phase from the address buffer signal and has the same pulse width as the address buffer signal. And an output unit(204) outputs an address transition detecting signal by inverting one of outputs of the first and the second detection unit.
申请公布号 KR20030002716(A) 申请公布日期 2003.01.09
申请号 KR20010038416 申请日期 2001.06.29
申请人 HYNIX SEMICONDUCTOR INC. 发明人 SHIN, TAE SEUNG
分类号 G11C11/41;G11C8/18;G11C11/407;H03K5/1252;(IPC1-7):G11C8/18 主分类号 G11C11/41
代理机构 代理人
主权项
地址