| 摘要 |
The present invention relates to a method for testing a conductor element (20) applicable to locating, a continuity defect of the conductor element, the conductor element having, relative to a reference conductor, an insulation resistance and a leak capacitance. According to the present invention, the method comprises a step of injecting into the conductor element at least two currents (i1, i2) of different frequencies by means of a current or voltage generator (23), one terminal of which is connected to the reference conductor, at least one step of measuring the amplitudes of currents at one measuring point (Pi) chosen along the conductor element, and a step of calculating the imaginary part of currents and/or calculating the leak capacitance of the conductor element downstream from the measuring point (P1).
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