发明名称 METHOD FOR FABRICATING TUNGSTEN LAYER
摘要 PURPOSE: A method for fabricating a tungsten layer is provided to improve the surface roughness of the tungsten layer without decreasing productivity by reducing an interval of time for nucleation and tungsten growth while uniformly maintaining the overall deposition time. CONSTITUTION: A tungsten nucleus(22) is formed on a semiconductor substrate. A tungsten layer(24) is grown from the nucleus. A tungsten nucleus(26) is formed again after the growth of the tungsten layer. A tungsten layer(28) is grown from the nucleus again. At least three steps out of the abovementioned four steps are repeated to stack the tungsten layers wherein bias power is applied to make the growth direction of the tungsten layer.
申请公布号 KR20030002790(A) 申请公布日期 2003.01.09
申请号 KR20010038499 申请日期 2001.06.29
申请人 HYNIX SEMICONDUCTOR INC. 发明人 KIM, JEONG GEUN;PARK, SEONG GI
分类号 H01L21/20;(IPC1-7):H01L21/20 主分类号 H01L21/20
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