发明名称 SIDEWALL SPACER DEFINITION OF GATES
摘要 A method of forming features on a semiconductor device uses sidewall spacers, and includes providing a sidewall template (210) having first (224) and second (228) sidewall regions. A spacer layer (212) of a spacer material is formed over the sidewall template (210). The spacer layer (212) is then etched in a first etch to remove a first region (222) of the spacer layer over the first sidewall region (224) while leaving a second region (226) of the spacer layer (212) over the second sidewall region (228). The spacer layer (212) is again etched in a second etch to for at least one sidewall spacer (234).
申请公布号 WO03003436(A1) 申请公布日期 2003.01.09
申请号 WO2002US02994 申请日期 2002.01.31
申请人 ADVANCED MICRO DEVICES, INC. 发明人 LUKANC, TODD, P.;LYONS, CHRISTOPHER, F.
分类号 H01L21/28;(IPC1-7):H01L21/28 主分类号 H01L21/28
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