发明名称 METHOD FOR MANUFACTURING SEMICONDUCTOR DEVICE
摘要 PURPOSE: A fabrication method of a semiconductor device is provided to constantly maintain a step-difference of an align key by using different etching selectivity. CONSTITUTION: An STI(Shallow Trench Isolation) is formed by selectively etching a semiconductor substrate(11). A polysilicon layer and an oxide layer having different etching selectivity are sequentially filled into the STI region. After selectively etching the oxide layer, the step-difference has about 1200Å. That is, the step-difference of a key region(100) maintains constantly about 1200Å. Then, an oxide layer(21) and a silane(23) are sequentially formed on the resultant structure.
申请公布号 KR20030002271(A) 申请公布日期 2003.01.08
申请号 KR20010039045 申请日期 2001.06.30
申请人 HYNIX SEMICONDUCTOR INC. 发明人 HWANG, YEONG SEON;LEE, SEONG GU
分类号 H01L21/027;(IPC1-7):H01L21/027 主分类号 H01L21/027
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