发明名称 |
METHOD FOR MANUFACTURING SEMICONDUCTOR DEVICE |
摘要 |
PURPOSE: A fabrication method of a semiconductor device is provided to constantly maintain a step-difference of an align key by using different etching selectivity. CONSTITUTION: An STI(Shallow Trench Isolation) is formed by selectively etching a semiconductor substrate(11). A polysilicon layer and an oxide layer having different etching selectivity are sequentially filled into the STI region. After selectively etching the oxide layer, the step-difference has about 1200Å. That is, the step-difference of a key region(100) maintains constantly about 1200Å. Then, an oxide layer(21) and a silane(23) are sequentially formed on the resultant structure.
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申请公布号 |
KR20030002271(A) |
申请公布日期 |
2003.01.08 |
申请号 |
KR20010039045 |
申请日期 |
2001.06.30 |
申请人 |
HYNIX SEMICONDUCTOR INC. |
发明人 |
HWANG, YEONG SEON;LEE, SEONG GU |
分类号 |
H01L21/027;(IPC1-7):H01L21/027 |
主分类号 |
H01L21/027 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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