发明名称 SURFACE GEOMETRY MEASURING METHOD AND APPARATUS
摘要 PROBLEM TO BE SOLVED: To accurately measure the shape of a spherical surface or an aspherical surface without problems of vignetting. SOLUTION: Assume a spherical surface is located at a position, where a surface to be inspected is arranged, a surface 1 to be inspected being arranged at the position where the surface to be inspected is arranged is scanned by applying coherent light 40, passing through a curvature center O of the assumed spherical surface on each of a plurality of meridional sections, on the assumed spherical surface passing through the position where the surface to be inspected is arranged, and the deviation between the surface to be inspected and the assumed spherical surface is subjected to light interference length measurement by the reflected light from the surface to be inspected.
申请公布号 JP2003004424(A) 申请公布日期 2003.01.08
申请号 JP20010187562 申请日期 2001.06.21
申请人 CANON INC 发明人 YOSHII MINORU;TAKEUCHI SEIJI
分类号 G01B11/24;G01J9/02;G01M11/00;H01L21/027;(IPC1-7):G01B11/24 主分类号 G01B11/24
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