发明名称 MEASUREMENT APPARATUS
摘要 PROBLEM TO BE SOLVED: To provide a measurement apparatus the inspection time of which can be shortened, when the same inspection is conducted repeatedly. SOLUTION: In the measurement apparatus 1, an inspection program is input by an input means 10, the inspection program to be input by the input means 10 is stored by a storage means 11, the inspection program to be stored by the storage means 11 is read out, so as to be sequentially executed by an inspection-program executing means 12, a measuring means 13 executes a specific measurement by using the set value of the inspection program to be given by the executing means 12, it makes a set content variable according to a signal to be measured during an inspection, a measurement-setting storage means 14 feeds back the set value of the measuring means 13 to the inspection program, after the finish of the inspection.
申请公布号 JP2003004789(A) 申请公布日期 2003.01.08
申请号 JP20010184635 申请日期 2001.06.19
申请人 MATSUSHITA ELECTRIC IND CO LTD 发明人 AMAO YUKINORI;IZUMI TAMIHIRO
分类号 G01R31/28;G01R31/00;(IPC1-7):G01R31/00 主分类号 G01R31/28
代理机构 代理人
主权项
地址