发明名称 Control gate and word line voltage boosting scheme for twin MONOS memory cells
摘要 <p>This invention provides a circuit and a method for providing an override voltage to control gates through boosting of a selected word line for TWIN metal oxide, nitride semiconductor MONOS memory. The boosted voltages are required to program, erase and read the 2-bit MONOS memory cell in this invention. This invention relates to providing a means of using capacitive coupling between selected word lines and neighboring control gates to boost the voltage for the program, erase and write modes of MONOS memory. Capacitive coupling to boost the voltage on the control gates adjacent to the selected word lines is used instead of generating the required boosted voltage through the control gate and bit line decoders and drivers. This voltage boosting method saves address decoder silicon area, decoder circuit complexity, reduces address decode set-up time, and eliminates the need for extra voltage supplies for address decoders. &lt;IMAGE&gt;</p>
申请公布号 EP1274096(A2) 申请公布日期 2003.01.08
申请号 EP20020368073 申请日期 2002.07.05
申请人 HALO LSI DESIGN AND DEVICE TECHNOLOGY INC. 发明人 OGURA, NORI;OGURA, SEIKI
分类号 G11C16/06;G11C8/08;G11C11/56;G11C16/04;G11C16/08;G11C16/30;H01L21/822;H01L21/8247;H01L27/04;H01L27/115;H01L29/788;H01L29/792;(IPC1-7):G11C16/08 主分类号 G11C16/06
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