| 摘要 |
PROBLEM TO BE SOLVED: To measure the electrophotographic process characteristics of a photoreceptor and to precisely and efficiently measure the intrinsic characteristics (property values) of the photoreceptor. SOLUTION: The processing to compute the film thickness of the photosensitive layer of the photoreceptor 1 by the result measured by a displacement sensor 7 of a contact type, the processing to compute the electrostatic capacity of the photosensitive layer from the measured surface potential and electrostatic charging current when the photoreceptor 1 is electrostatically charged by an electrostatic charging unit 2, the processing to compute the specific dialectic constant of the photosensitive layer from the computed electrostatic capacity and the film thickness of the photosensitive layer, the processing to compute a dark attenuation constant from the surface potential after the electrostatic charging is stopped by the electrostatic charging unit 2 and the time after the electrostatic charging is stopped and the processing to compute a specific resistance from the computed dark attenuation constant, the electrostatic capacity of the photosensitive layer and the film thickness are automatically executed, by which the electrophotographic process characteristics of the photoreceptor and the intrinsic characteristics (property values) of the photoreceptor are evaluated with one unit of the characteristic evaluation device.
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