发明名称 MATERIAL TEST MACHINE
摘要 PROBLEM TO BE SOLVED: To provide a material test machine equipped with means for moving a sample in which the possibility of having an effect on the measurement is extremely low even when a heavy load is applied. SOLUTION: The material test machine 1 for measuring the material characteristics of a sample S based on an indentation formed on the surface of the sample by means of an indentation chip 2b comprises a sample stage 101 having an upper surface part for mounting the sample and a smooth lower surface part 101a, a sample stage base 102 having a smooth upper surface part 102a coming into face contact with the lower surface part of the sample stage, a first moving means 109 for moving the sample stage while sliding on the upper surface part of the sample stage base, and a second moving means 111 for moving the sample stage and the first moving means on the upper surface part of the sample stage base.
申请公布号 JP2003004614(A) 申请公布日期 2003.01.08
申请号 JP20010189975 申请日期 2001.06.22
申请人 AKASHI CORP 发明人 KAWAZOE MASARU;KAGUMA HIDEO;ODA MITSURU
分类号 G01N3/42;C04B28/26;C04B38/06;(IPC1-7):G01N3/42 主分类号 G01N3/42
代理机构 代理人
主权项
地址