发明名称 ELECTRONIC SPECTROSCOPE AND METHOD FOR ADJUSTING POSITION LENS AXIS IN ELECTRONIC SPECTROSCOPE
摘要 <p>PROBLEM TO BE SOLVED: To provide an electronic spectroscope capable of aligning the axis of an image forming lens with the optical axis of a decelerating lens and a method for adjusting the position of the lens axis. SOLUTION: A sample 5 is retraced from the optical axis O. Then the image forming lens 9 is controlled in such a way that the image of photo-electrons emitted from index substance 13 is formed in a field restricting aperture 20. The diameter of the opening of the field restricting aperture 20 is set in a size suitable for the outer diameter of the index matter. The upper surface of the image forming lens 9 is irradiated with X-rays from an X-ray source 4. The photo-electrons emitted from the index substance 13 by the X-ray irradiation are detected by a detector 19, and a control device 23 obtains a signal intensity value I1 of the photo-electrons emitted from the index substance on the basis of the output of the detector 19. As watching the signal intensity value I1 displayed on a display screen, an operator adjusts a mechanism 15 for adjusting the position of the image forming lens 9 in such a way that the signal intensity value I1 takes a maximum value to adjust the x- and y-positions of the image forming lens 9.</p>
申请公布号 JP2003004676(A) 申请公布日期 2003.01.08
申请号 JP20010182192 申请日期 2001.06.15
申请人 JEOL LTD 发明人 TAZAWA TOYOHIKO
分类号 G01N23/227;G21K7/00;H01J37/04;H01J49/06;(IPC1-7):G01N23/227 主分类号 G01N23/227
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