发明名称 Test handler apparatus for SMD, BGA, and CSP
摘要 <p>A test handler apparatus (1), having a treatment area (3); a testing station (5) in the treatment area; and an output unit (9) connected to an output of the treatment area. An input unit (2) picks singulated or stripped packages (30) and unloads them on carrier boats (12) in a loading zone (4); a conveyor mechanism (20, 6, 26, 47) transfers the carrier boats (12) from the loading zone through the treatment area to the testing station and from the testing station to the output unit (9). In practice, the carrier boat (4) forms a universal carrier which is able to contain multiple singulated or strip packages for the purpose of testing. Placing packages onto carriers with standardized dimension allows handler equipment to accommodate the packages in singulated or strip condition. &lt;IMAGE&gt;</p>
申请公布号 EP1273925(A2) 申请公布日期 2003.01.08
申请号 EP20020014568 申请日期 2002.07.01
申请人 STMICROELECTRONICS SDN BHD 发明人 SENG, LEE BOON;YONG, TAN KEK
分类号 G01R31/28;(IPC1-7):G01R31/316 主分类号 G01R31/28
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