发明名称 Add-compare-select circuit for viterbi decoder
摘要 There is provided a viterbi decoder for decoding convolutional data. The convolutional data includes punctured data and non punctured data. The decoder includes a branch metric unit for calculating branch metrics of the received convolutional data. An add-compare-select unit selects current and next path selection information and calculates a current state metric and a next state metric of the punctured data, from the branch metrics and a previous state metric. A traceback unit traces the current and the next path selection information selected in the add-compare-select unit to find a maximum likelihood path from which the convolutional data was received, and outputs decoded data. A controller generates a plurality of decoding control signals to the branch metric unit, the add-compare-select unit, and the traceback unit.
申请公布号 US6504882(B1) 申请公布日期 2003.01.07
申请号 US19990397756 申请日期 1999.09.16
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 KIM YONG-CHAN
分类号 H03M13/23;H04L1/00;(IPC1-7):H03D1/00;H04L27/06 主分类号 H03M13/23
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