发明名称 ESD PROTECTION CIRCUIT OF SEMICONDUCTOR DEVICE
摘要 PURPOSE: An ESD(Electro-Static Discharge) protection circuit of a semiconductor device is provided to improve a protection capability by enhancing a contact area between silicon and metal. CONSTITUTION: The ESD protection circuit is provided with a plurality of MOS transistors. In the MOS transistors, a long gate(70) is arranged on an active region(50). A contact(65) is electrically connected between silicon and metal formed on a source and/or a drain region. At this time, the length of the contact(65) is long. That is, the contact area between silicon and metal is increased, so that the protection capability of ESD is improved.
申请公布号 KR20030000958(A) 申请公布日期 2003.01.06
申请号 KR20010037234 申请日期 2001.06.27
申请人 HYNIX SEMICONDUCTOR INC. 发明人 JANG, MUN GYU
分类号 H01L27/04;(IPC1-7):H01L27/04 主分类号 H01L27/04
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