发明名称 |
METHOD FOR FORMING CAPACITOR OF SEMICONDUCTOR DEVICE |
摘要 |
PURPOSE: A concave-type capacitor formation method of semiconductor devices is provided to simplify manufacturing processes and to improve yield by forming a storage electrode using a micro-loading effect. CONSTITUTION: A storage conductive layer is formed on a semiconductor substrate(111). A photoresist layer is coated on the storage conductive layer. A photoresist pattern(113) is formed by exposing and developing the photoresist layer using a phase shift mask. The phase shift mask includes a region(103) having 0 degree phase and a region(101) having 108 degree phase. At this time, a latent image(105) has a dark intensity at the boundary between the region(103) having 0 degree phase and the region(101) having 108 degree phase. Thereby, a planar structure of a storage electrode is formed at the boundary between the region(103) having 0 degree phase and the region(101) having 108 degree phase.
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申请公布号 |
KR20030000566(A) |
申请公布日期 |
2003.01.06 |
申请号 |
KR20010036597 |
申请日期 |
2001.06.26 |
申请人 |
HYNIX SEMICONDUCTOR INC. |
发明人 |
BOK, CHEOL GYU;SHIN, GI SU |
分类号 |
H01L27/108;H01L21/02;H01L21/3213;(IPC1-7):H01L27/108 |
主分类号 |
H01L27/108 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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