发明名称 |
APPARATUS FOR TRANSFERRING SEMICONDUCTOR WAFER |
摘要 |
PURPOSE: An apparatus for transferring a semiconductor wafer is provided to prevent the wafer from colliding with process equipment or a wafer cassette by using the wafer transfer apparatus including a collision avoidance sensor, and to evaluate the tilt of the wafer transfer apparatus by using a horizontality checking apparatus. CONSTITUTION: A blade(120) fixes to transfer the semiconductor wafer. An approach checking sensor(200) measures a distance between the blade and the process equipment, installed in the blade. The horizontality checking apparatus(300) displays the horizontality of the blade, installed in the blade. A driving unit transfers the blade in a predetermined direction. A control unit controls the operation of the driving unit.
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申请公布号 |
KR20030000612(A) |
申请公布日期 |
2003.01.06 |
申请号 |
KR20010036649 |
申请日期 |
2001.06.26 |
申请人 |
SAMSUNG ELECTRONICS CO., LTD. |
发明人 |
PARK, GWANG HO |
分类号 |
H01L21/68;(IPC1-7):H01L21/68 |
主分类号 |
H01L21/68 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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