| 摘要 |
<p>An analyser arrangement is used for repeatedly analysing the composition of a target material flow. An X-ray radiation source (123, 205) irradiates the target material flow and a detector arrangement (120, 121, 303, 304, 305, 309) detects fluorescent radiation quanta. A cooler arrangement (308, 319, 500, 501, 502, 503, 504) keeps at least parts of the detector arrangement at a low temperature. Processing electronics (311, 401, 404, 405) convert detection results into concentration values that describe the analysed composition of the target material flow. The X-ray radiation source (123, 205) is an X-ray tube. The analyser arrangement further comprises a controllable high voltage source (204) that is coupled to said X-ray tube (123, 205). The detector arrangement comprises a solid-state semiconductor detector element (303), and the cooler arrangement (308, 319, 500, 501, 502, 503, 504) comprises a peltier element. The X-ray radiation source (123, 205), the high voltage source (204), the detector arrangement (120, 121, 303, 304, 305, 309), the cooler arrangement (308, 319, 500, 501, 502, 503, 504) and the processing electronics (311, 401, 404, 405) are all located within a single mechanical entity (107).</p> |
