发明名称 CONTROLLED RESISTIVITY BORON NITRIDE ELECTROSTATIC CHUCK APPARATUS FOR RETAINING A SEMICONDUCTOR WAFER AND METHOD OF FABRICATING THE SAME
摘要 <p>Apparatus (Figure 1) for retaining a workpiece in a semiconductor processing chamber (100) and method for fabricating the same. In one embodiment, a method for fabricating the apparatus includes providing a controlled resistivity boron nitride (CRBN) plate. A conductive layer is disposed on a portion of a lower surface of the CRBN plate to form at least one chucking electrode (116). A layer of boron nitride powder is disposed on the conductive layer and the lower surface of the CRBN plate. The CRBN plate, the conductive layer, and the boron nitride powder are hot pressed together to form the apparatus. In a second embodiment, a conductive electrode layer is deposited on a portion of a lower surface of the CRBN plate. A layer of pyrolytic boron nitride is deposited on the conductive layer and the lower surface of the CRBN plate to form the apparatus.</p>
申请公布号 WO2003001658(A1) 申请公布日期 2003.01.03
申请号 US2002019342 申请日期 2002.06.18
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