Algorithmically programmable memory tester with test sites operating in a slave mode

摘要

A Test Station for a memory tester is comprised of one or more Test Sites that are each individually algorithmically controllable, that can each deal with as many as sixty-four channels, and that can be bonded together to form a Multi-Site Test Station of two or more Test Sites. Up to nine Test Sites can be bonded together as a single Multi-Site Test Station. Bonded Test Sites still operate at the highest speeds they were capable of when not bonded. To bring this about it is necessary to implement certain programming conventions and to provide certain housekeeping functions relating to simultaneous starting of separate test programs on the bonded Test Sites, and relating to propagation and synchronization of test program qualifier results among those separate test programs. There also is a suspend/resume test program execution mechanism that assists one test program in temporarily interrupting the others to allow time for a change within one or more of the Test Sites of a measurement parameter, such as a voltage comparison threshold.