发明名称 |
Memory clearing involves applying volume voltage, higher gate voltage to conductive electrode, signals with voltages higher than gate voltage to diffusion regions for clearing time. |
摘要 |
The method involves applying a voltage to a volume region (100) for a given clearing time, applying a higher gate voltage to a conductive electrode (240) for the clearing time, applying a first signal with voltage higher than the gate voltage to a first discontinuity diffusion region (120) for the clearing time and applying a second signal with a different voltage higher than the gate voltage to a second diffusion region (140) for the clearing time.
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申请公布号 |
DE10227551(A1) |
申请公布日期 |
2003.01.02 |
申请号 |
DE20021027551 |
申请日期 |
2002.06.14 |
申请人 |
SAMSUNG ELECTRONICS CO., LTD. |
发明人 |
LEE, YONG-KYU;KIM, DONG-JUN;CHO, MIN-SOO;RYU, EUI-YOUL;KIM, JIN-HO |
分类号 |
G11C16/02;G11C16/14;H01L21/8247;H01L27/115;H01L29/788;H01L29/792;(IPC1-7):G11C16/14 |
主分类号 |
G11C16/02 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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