发明名称 Memory clearing involves applying volume voltage, higher gate voltage to conductive electrode, signals with voltages higher than gate voltage to diffusion regions for clearing time.
摘要 The method involves applying a voltage to a volume region (100) for a given clearing time, applying a higher gate voltage to a conductive electrode (240) for the clearing time, applying a first signal with voltage higher than the gate voltage to a first discontinuity diffusion region (120) for the clearing time and applying a second signal with a different voltage higher than the gate voltage to a second diffusion region (140) for the clearing time.
申请公布号 DE10227551(A1) 申请公布日期 2003.01.02
申请号 DE20021027551 申请日期 2002.06.14
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 LEE, YONG-KYU;KIM, DONG-JUN;CHO, MIN-SOO;RYU, EUI-YOUL;KIM, JIN-HO
分类号 G11C16/02;G11C16/14;H01L21/8247;H01L27/115;H01L29/788;H01L29/792;(IPC1-7):G11C16/14 主分类号 G11C16/02
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