发明名称 Verfahren und System zur Prüfung einer Anordnung und elektrische Prüfvorrichtung für eine Blitzlichteinheit
摘要 <p>An inspection system for assemblies, especially for flash units of used film packages as to if the flash units are reusable. The inspection system circulates pallets each holding a flash unit in a predetermined posture around a plurality of inspection stations for various inspection items. Inspection data detected in each inspection station is written in a memory of the pallet through a data communication system disposed in each pallet and each inspection station. A computer reads the memory for classifying the flash unit on the basis of the inspection data on all inspection items and writes classification data in the memory. A plurality of electrical inspection apparatuses are disposed in the inspection system for simultaneously inspecting electrical properties of a plurality of flash units. Each inspection apparatus has proving pins, an actuator and a photo-sensor which are moved into their operative positions when the pallet holding the flash unit is stopped at the inspection apparatus, wherein the inspection apparatus charges a main capacitor with a high D.C. voltage while measuring the voltage of the main capacitor. <IMAGE></p>
申请公布号 DE69431746(D1) 申请公布日期 2003.01.02
申请号 DE1994631746 申请日期 1994.12.13
申请人 FUJI PHOTO FILM CO., LTD. 发明人 ICHIKAWA, FUSAO;MORI, RYO;OTA, HIROYUKI
分类号 B07C5/344;G03B15/05;G03B19/04;G03B43/00;H05B41/32;(IPC1-7):G03B19/04;B07C3/12 主分类号 B07C5/344
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