Semiconductor memory device, and method for testing the same

摘要

A semiconductor memory device and a method for testing the same is disclosed. The device and method can optimize operation conditions by detecting a test cell that may easily fail in a test among the memory cells passing a burn-in test, and detecting the worst operation conditions by performing the test on the test cell. The device and method reduce power consumption in a refresh or active operation. According to the disclosed device and method, a test unit tests a test cell, controls operation conditions of the semiconductor memory device according to the test result, and outputs the operation conditions. A driving unit drives the semiconductor memory device using the operation conditions controlled by the test unit.