发明名称 |
Method of testing radiation for a SDRAM |
摘要 |
A method for testing for radiation on a synchronized dynamic random access memory (SDRAM), wherein an irradiation controller irradiates the SDRAM. The status of the SDRAM after a radiation test are calculated. The radiation tests comprise SEU, micro latch-up, SEL and get rapture tests. From the radiation test, we can understand the condition of the SDRAM before and after the radiation test.
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申请公布号 |
US2003001597(A1) |
申请公布日期 |
2003.01.02 |
申请号 |
US20010895549 |
申请日期 |
2001.06.28 |
申请人 |
JUHN LI-SHEN;WU KUANG-SHYR;LIN MAW-CHING |
发明人 |
JUHN LI-SHEN;WU KUANG-SHYR;LIN MAW-CHING |
分类号 |
G01R31/00;G01R31/28;G11C5/00;G11C29/40;G11C29/50;(IPC1-7):G01R31/302 |
主分类号 |
G01R31/00 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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