| 摘要 |
The present invention provides a systematic means of switching contiguous segments of each production-test shift-register into several diagnostic scan-configurations. If the functional scan-verification tests fail for the production-test scan-configuration, then these same verification tests can be repeated for the alternative, diagnostic scan configurations. Using the principle of superposition, the passing and failing LSSD flush/scan tests for these diagnostic configurations will allow the failing location to be localized to a single segment of the original failing shift-register. |
