发明名称 Method and apparatus for determining optimum size of LSI chip
摘要 An apparatus for determining the optimum size of a LSI chip of the present invention has the-theoretical-number-of-chips calculating means 5 calculating the theoretical number of chips according to a chip configuration in a mask calculated by in-the-mask-chip-configuration calculating means 3 and the information of wafer-line information holding part 4; the-number-of-transcriptions calculating means 6 calculating the number of transcriptions of a layout pattern on the mask to a wafer according to the chip configuration in the mask calculated by in-the-mask-chip configuration calculating means 3 and the theoretical number of chips calculated by the-theoretical-number-of-chips calculating means 5; and display part 9 that displays the calculated theoretical number of chips and number of transcriptions.
申请公布号 US2003005395(A1) 申请公布日期 2003.01.02
申请号 US20020153595 申请日期 2002.05.24
申请人 CHISAKA KENICHIROU;UMEDA KOUICHIROU;ISHIBASHI MANABU 发明人 CHISAKA KENICHIROU;UMEDA KOUICHIROU;ISHIBASHI MANABU
分类号 G03F7/20;G06F17/50;H01L21/82;(IPC1-7):G06F17/50 主分类号 G03F7/20
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