发明名称 |
Method and apparatus for determining optimum size of LSI chip |
摘要 |
An apparatus for determining the optimum size of a LSI chip of the present invention has the-theoretical-number-of-chips calculating means 5 calculating the theoretical number of chips according to a chip configuration in a mask calculated by in-the-mask-chip-configuration calculating means 3 and the information of wafer-line information holding part 4; the-number-of-transcriptions calculating means 6 calculating the number of transcriptions of a layout pattern on the mask to a wafer according to the chip configuration in the mask calculated by in-the-mask-chip configuration calculating means 3 and the theoretical number of chips calculated by the-theoretical-number-of-chips calculating means 5; and display part 9 that displays the calculated theoretical number of chips and number of transcriptions.
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申请公布号 |
US2003005395(A1) |
申请公布日期 |
2003.01.02 |
申请号 |
US20020153595 |
申请日期 |
2002.05.24 |
申请人 |
CHISAKA KENICHIROU;UMEDA KOUICHIROU;ISHIBASHI MANABU |
发明人 |
CHISAKA KENICHIROU;UMEDA KOUICHIROU;ISHIBASHI MANABU |
分类号 |
G03F7/20;G06F17/50;H01L21/82;(IPC1-7):G06F17/50 |
主分类号 |
G03F7/20 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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