Needles for probe card for testing semi conductor devices, manufacturing procedure and positioning procedure

摘要

The test needle (1) is made from tungsten or a copper/beryllium alloy and connected at one end (3) to the testing card via a resin testing ring. The needle then comprises a rectilinear portion (4) followed by a curved section (5). Two rectilinear branches (6,7) at slightly different angles take off from the curved section and terminate in points (8.9). Both points are aligned to touch a contact (2) of a semi-conductor (111)