发明名称 Method of fabricating capacitor having hafnium oxide
摘要 Disclosed herein is a method of fabricating a capacitor. The method includes the steps of: forming a Ti1-x HfxN layer on a substrate, wherein x is in a range from 0 to 0.5; forming an electrode layer on the Ti1-xHfxN layer; and forming a HfO2 layer on an interface between the electrode layer and the Ti1-xHfxN layer by performing a thermal treatment in an oxygen gas-containing atmosphere.
申请公布号 US2003003648(A1) 申请公布日期 2003.01.02
申请号 US20020141713 申请日期 2002.05.09
申请人 HYNIX SEMICONDUCTOR, INC. 发明人 SONG CHANG-ROCK
分类号 H01L27/108;H01L21/02;H01L21/285;H01L21/316;(IPC1-7):H01L21/824 主分类号 H01L27/108
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