发明名称 |
Method of fabricating capacitor having hafnium oxide |
摘要 |
Disclosed herein is a method of fabricating a capacitor. The method includes the steps of: forming a Ti1-x HfxN layer on a substrate, wherein x is in a range from 0 to 0.5; forming an electrode layer on the Ti1-xHfxN layer; and forming a HfO2 layer on an interface between the electrode layer and the Ti1-xHfxN layer by performing a thermal treatment in an oxygen gas-containing atmosphere.
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申请公布号 |
US2003003648(A1) |
申请公布日期 |
2003.01.02 |
申请号 |
US20020141713 |
申请日期 |
2002.05.09 |
申请人 |
HYNIX SEMICONDUCTOR, INC. |
发明人 |
SONG CHANG-ROCK |
分类号 |
H01L27/108;H01L21/02;H01L21/285;H01L21/316;(IPC1-7):H01L21/824 |
主分类号 |
H01L27/108 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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