| 发明名称 |
Semiconductor chip, memory module and method for testing the semiconductor chip |
| 摘要 |
A lowermost layer of control chips carries on it layers of memory chips. The memory chips are contacted via looped-through contacts that reach from one side of the other side of the memory chips and they are driven by the control chips that contain the test circuit for the memory chips. |
| 申请公布号 |
US2003001236(A1) |
申请公布日期 |
2003.01.02 |
| 申请号 |
US20020159848 |
申请日期 |
2002.05.31 |
| 申请人 |
HEDLER HARRY;MULLER JOCHEN;VASQUEZ BARBARA |
发明人 |
HEDLER HARRY;MULLER JOCHEN;VASQUEZ BARBARA |
| 分类号 |
G11C29/48;G11C29/56;(IPC1-7):H01L29/40 |
主分类号 |
G11C29/48 |
| 代理机构 |
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代理人 |
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| 主权项 |
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| 地址 |
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