发明名称 Thin titanium nitride layers used in conjunction with tungsten
摘要 Titanium nitride layers a less than 30 nm thickness are formed by physical vapor deposition and used as barrier layers for tungsten deposition. The titanium nitride layers are annealed in the presence of nitrogen or a nitrogen compound.
申请公布号 US2003001265(A1) 申请公布日期 2003.01.02
申请号 US20010881607 申请日期 2001.06.13
申请人 FORTIN VINCENT 发明人 FORTIN VINCENT
分类号 H01L21/285;H01L21/768;H01L23/532;(IPC1-7):H01L23/52;H01L23/48 主分类号 H01L21/285
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