发明名称 Method for fabricating a ferroelectric memory configuration
摘要 The invention provides a method. In a first step of a method for fabricating a ferroelectric memory configuration, there is provided a substrate having a multiplicity of memory cells. Each of the memory cells has at least one select transistor, at least one short-circuit transistor, and at least one ferroelectric capacitor. The transistors are connected in an electrically conductive manner to a first of the electrodes of the ferroelectric capacitor. In the next step, at least one electrically insulating layer is applied. In the next step, at least one contact hole for connecting a second electrode of the ferroelectric capacitors is produced. Next, contact holes for connecting the short-circuit transistors are produced. Next, the contact holes are filled with electrically conductive material. Next, an electrically conductive layer is applied and patterned, so that the second electrodes of the ferroelectric capacitors are each conductively connected to the short-circuit transistors.
申请公布号 US6500677(B2) 申请公布日期 2002.12.31
申请号 US20010027106 申请日期 2001.12.26
申请人 INFINEON TECHNOLOGIES AG 发明人 BERGMANN RENATE;DEHM CHRISTINE;ROEHR THOMAS;BRAUN GEORG;HOENIGSCHMID HEINZ;SCHINDLER GUENTHER
分类号 H01L21/8246;H01L27/115;(IPC1-7):H01L21/00 主分类号 H01L21/8246
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