发明名称 |
SEMICONDUCTOR MEMORY DEVICE AND ITS MANUFACTURING METHOD |
摘要 |
PURPOSE: To provide a semiconductor memory device for improving integration degree by reducing the influence of reverse bias effect of the memory device which has a charge storage layer and a control gate, further increasing the ratio of the volumes of a floating gate to the control gate, without increasing an occupying area and suppressing an unevenness of cell characteristics due to a manufacturing process, and to provide a method for manufacturing the same. CONSTITUTION: The semiconductor memory device comprises a semiconductor substrate and at least one memory cell having at least one island-like semiconductor layer; a charge storage layer formed on the entire or a partial periphery of the sidewall of the semiconductor layer and a control gate. In this memory device, at least one of the cells is electrically insulated from the substrate.
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申请公布号 |
KR20020096010(A) |
申请公布日期 |
2002.12.28 |
申请号 |
KR20010047739 |
申请日期 |
2001.08.08 |
申请人 |
FUJIO MASUOKA;SHARP CORPORATION |
发明人 |
ENDOH TETSUO;MASUOKA FUJIO;TAKEUCHI NOBORU;TANIGAMI TAKUJI;YOKOYAMA TAKASHI |
分类号 |
G11C16/04;H01L21/28;H01L21/336;H01L21/8242;H01L21/8244;H01L21/8246;H01L21/8247;H01L21/84;H01L27/108;H01L27/11;H01L27/115;H01L27/12;H01L29/788;H01L29/792;(IPC1-7):H01L27/115;H01L21/824 |
主分类号 |
G11C16/04 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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