发明名称 A PERMANENTLY-ON TRANSISTOR BURIED CONTACT
摘要 <p>A permanently-ON MOS transistor (21) comprises silicon source and drain regions (9) of a first conductivity type in a silicon well region (3) of a second conductivity type. A silicon contact region (15) of the first conductivity types is buried in the well region, said contact region contacting said source region and said drain region. A first gate insulating layer (2) is selectively placed over the silicon source and drain regions. A second gate insulating layer (7) is selectively placed over the first gate insulating layer and over the silicon contact region. A polysilicon gate region (8', 8') is placed over the second gate insulating layer.</p>
申请公布号 WO2002103805(A1) 申请公布日期 2002.12.27
申请号 US2002019075 申请日期 2002.06.13
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