发明名称 Method and structure for reducing contact aspect ratios
摘要 An intermediate metal plug is used to raise the platform to which contact is to be made. In the illustrated process, a partial bit line plug is formed adjacent a stacked capacitor, and an interlevel dielectric formed over the capacitor. The bit line contact is completed by extending a via from the bit line, formed above the interlevel dielectric, down to the level of the intermediate plug, and the via is filled with metal. The height of the via to be filled is thus reduced by the height of the intermediate plug. In one embodiment, the intermediate plug is slightly shorter than an adjacent container-shaped capacitor. In another embodiment, the intermediate plug is about as high as an adjacent stud capacitor.
申请公布号 US2002195639(A1) 申请公布日期 2002.12.26
申请号 US20020235452 申请日期 2002.09.04
申请人 DEBOER SCOTT J.;AGARWAL VISHNU K. 发明人 DEBOER SCOTT J.;AGARWAL VISHNU K.
分类号 H01L21/02;H01L21/768;H01L21/8242;H01L23/528;H01L27/108;(IPC1-7):H01L29/76;H01L29/94 主分类号 H01L21/02
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