发明名称 THIN-FILM MANUFACTURING METHOD
摘要 PROBLEM TO BE SOLVED: To provide technology for forming a group-III nitride based thin magnetic semiconductor film. SOLUTION: After an AIN layer 22 is formed on the surface of a substrate 21, a buffer layer 23 is formed of a GaN-based thin film on the surface of the AIN layer; and nitrogen-atom containing gas such as ammonia gas is introduced into the surface of the buffer layer 23 to carry out pyrolysis, and irradiation with molecular rays of a group-III element and molecular rays of a magnetic impurity element is carried out to a thin semiconductor thin film 24. The thin semiconductor thin film 24 shows ferromagnetism at room temperature. Further, GaN and Mn are a p-type at room temperature, so they are usable for a p-type layer of a semiconductor element.
申请公布号 JP2002373823(A) 申请公布日期 2002.12.26
申请号 JP20010296186 申请日期 2001.09.27
申请人 ULVAC JAPAN LTD 发明人 SONODA SAKI;SHIMIZU SABURO
分类号 C23C14/06;H01F10/193;H01F41/30;H01L21/203;(IPC1-7):H01F41/30 主分类号 C23C14/06
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