发明名称 Semi-insulating material testing and optimization
摘要 A test system and data analysis procedure are provided for use in electrophotographic printing with a whole set of characteristics determined to be important for efficiency and high quality images. The test system and data analysis procedure characterize dielectric relaxation processes in materials in terms of charge transport parameters that may include intrinsic charge density, charge mobility, and charge injection from the contact surfaces. The materials may include photoconductive drums or belts, charging rolls, developer rolls, intermediate transfer belts and output media such as paper transparencies or textiles. The apparatus consists of a charging source, a voltage detector and a current detector in an open-circuit mode of measurement. The configuration closely simulates the actual application of the materials in electrophotography and thus, can yield information more relevant for the applications.
申请公布号 US2002196028(A1) 申请公布日期 2002.12.26
申请号 US20020121436 申请日期 2002.04.12
申请人 QUALITY ENGINEERING ASSOCIATES, INC. 发明人 TSE MING-KAI
分类号 G03G15/16;G01N27/60;G03G5/00;G03G15/00;G03G15/08;G03G21/00 主分类号 G03G15/16
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