发明名称 METHOD FOR MANUFACTURING CONTACT HOLE IN SEMICONDUCTOR DEVICE
摘要 PURPOSE: A method for manufacturing a contact hole in a semiconductor device is provided to be capable of improving integration degree and increasing processing margin by using a selective-W film. CONSTITUTION: A planarization layer(2) is formed on a semiconductor substrate(1). A conductive layer(3) is formed on the planarization layer. A barrier insulating layer is formed on the conductive layer. The planarization layer(2) is exposed by selectively etching the barrier insulating layer and the conductive layer. A selective-W film(7) is formed at both sidewalls of the conductive layer(3). A contact hole(8) is then formed by etching the planarization layer(2) using the conductive layer and the selective-W film(7) as a mask.
申请公布号 KR100367494(B1) 申请公布日期 2002.12.26
申请号 KR19950050459 申请日期 1995.12.15
申请人 HYNIX SEMICONDUCTOR INC. 发明人 JUN, BEOM JIN;LEE, HO SEOK
分类号 H01L21/28;(IPC1-7):H01L21/28 主分类号 H01L21/28
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