发明名称 |
METHOD FOR MANUFACTURING CONTACT HOLE IN SEMICONDUCTOR DEVICE |
摘要 |
PURPOSE: A method for manufacturing a contact hole in a semiconductor device is provided to be capable of improving integration degree and increasing processing margin by using a selective-W film. CONSTITUTION: A planarization layer(2) is formed on a semiconductor substrate(1). A conductive layer(3) is formed on the planarization layer. A barrier insulating layer is formed on the conductive layer. The planarization layer(2) is exposed by selectively etching the barrier insulating layer and the conductive layer. A selective-W film(7) is formed at both sidewalls of the conductive layer(3). A contact hole(8) is then formed by etching the planarization layer(2) using the conductive layer and the selective-W film(7) as a mask.
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申请公布号 |
KR100367494(B1) |
申请公布日期 |
2002.12.26 |
申请号 |
KR19950050459 |
申请日期 |
1995.12.15 |
申请人 |
HYNIX SEMICONDUCTOR INC. |
发明人 |
JUN, BEOM JIN;LEE, HO SEOK |
分类号 |
H01L21/28;(IPC1-7):H01L21/28 |
主分类号 |
H01L21/28 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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