发明名称 Memory cell layout with double gate vertical array transistor
摘要 An 8F2 (2x2F wordline pitch by 2F bitline pitch) memory cell uses a vertical gate transistor having one gate driving two sources and two drains, one source and drain being formed on each side of the trench. Because two channels are provided, the device allows for sufficient current capacity, even with a 2F gate length. The memory cell array is formed in a series of active regions, corresponding to the bit lines of the array, which active regions are bounded by isolation trenches between the bit lines. The deep trenches segment the active regions and the overlying bit lines tie the cells of a given row together. Each memory cell has two drain regions, each having two contacts to the bit line and adjacent cells share one drain region, resulting in four contacts to the bit line for each memory cell. Support circuitry, including sense amplifiers
申请公布号 US2002196651(A1) 申请公布日期 2002.12.26
申请号 US20010888202 申请日期 2001.06.22
申请人 WEIS ROLF 发明人 WEIS ROLF
分类号 H01L21/8242;H01L27/108;(IPC1-7):H01L21/824;G11C17/00 主分类号 H01L21/8242
代理机构 代理人
主权项
地址