发明名称 High speed stripping for damaged photoresist
摘要 A method and system (100) for the stripping of photoresist layers using an electrostatically shielded RF (ESRF) plasma for the reduction of a crust and then the removal of the softened photoresist in an ESRF plasma. By varying the temperature during the two steps the method and system further provides the processing parameters for the needs of the stripping reaction.
申请公布号 US2002197870(A1) 申请公布日期 2002.12.26
申请号 US20020204263 申请日期 2002.08.20
申请人 JOHNSON WAYNE L 发明人 JOHNSON WAYNE L
分类号 C23C16/458;C23C16/46;H01L21/311;(IPC1-7):H01L21/302;H01L21/461 主分类号 C23C16/458
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