发明名称 Transistor fabrication method
摘要 A method of forming low stack height transistors having controllable linewidth in an integrated circuit without channeling is disclosed. A disposable hardmask of doped glass is utilized to define the gate and subsequently protect the gate (and the underlying substrate) during ion implantation which forms the source and drains. A variety of silicided and non-silicided) structures may be formed.
申请公布号 US2002197838(A1) 申请公布日期 2002.12.26
申请号 US20020224220 申请日期 2002.08.20
申请人 CHITTIPEDDI SAILESH;KOOK TAEHO;KORNBLIT AVINOAM 发明人 CHITTIPEDDI SAILESH;KOOK TAEHO;KORNBLIT AVINOAM
分类号 H01L21/285;H01L21/336;(IPC1-7):H01L21/476;H01L21/320;H01L21/44;H01L21/823 主分类号 H01L21/285
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