发明名称 |
METHOD OF FORMING DIELECTRIC LAYER OF CAPACITOR IN SEMICONDUCTOR DEVICE |
摘要 |
PURPOSE: A method of forming the dielectric layer of a capacitor is provided to improve capacitance property and performance of semiconductor device. CONSTITUTION: A dielectric layer comprised of an oxide and a nitride layer is formed on a lower capacitor electrode in semiconductor device. A silicon oxide layer formed on the lower capacitor electrode and a silicon nitride layer formed on the silicon oxide layer are sequentially formed in one equipment.
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申请公布号 |
KR20020095358(A) |
申请公布日期 |
2002.12.26 |
申请号 |
KR20010033552 |
申请日期 |
2001.06.14 |
申请人 |
SAMSUNG ELECTRONICS CO., LTD. |
发明人 |
KIM, YONG SU |
分类号 |
H01L21/31;(IPC1-7):H01L21/31 |
主分类号 |
H01L21/31 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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