发明名称 METHOD OF FORMING DIELECTRIC LAYER OF CAPACITOR IN SEMICONDUCTOR DEVICE
摘要 PURPOSE: A method of forming the dielectric layer of a capacitor is provided to improve capacitance property and performance of semiconductor device. CONSTITUTION: A dielectric layer comprised of an oxide and a nitride layer is formed on a lower capacitor electrode in semiconductor device. A silicon oxide layer formed on the lower capacitor electrode and a silicon nitride layer formed on the silicon oxide layer are sequentially formed in one equipment.
申请公布号 KR20020095358(A) 申请公布日期 2002.12.26
申请号 KR20010033552 申请日期 2001.06.14
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 KIM, YONG SU
分类号 H01L21/31;(IPC1-7):H01L21/31 主分类号 H01L21/31
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