METHOD OF DETECTING CHANGE POINT OF SIGNAL OUTPUTTED BY SEMICONDUCTOR DEVICE, METHOD OF TESTING SEMICONDUCTOR DEVICE, DEVICE FOR TESTING SEMICONDUCTOR DEVICE, AND TIME MEASURING DEVICE

摘要

PROBLEM TO BE SOLVED: To provide a testing method and a testing device for testing in a short time whether the difference between time up to the leading edge of a reference clock and time up to the leading edge of each data and the difference between time up to the trailing edge of the reference clock and time up to the trailing edge of each data are in a standard range or not in a semiconductor device formed to output data synchronously with the reference clock. SOLUTION: High-speed pulses are generated in every test cycle, and the high-speed pulses are counted to measure time in the test cycle. With this time measurement, time up to the rise of device output DOUT and time up to the fall are measured, and the difference between the time up to the leading edge of the reference clock and the time up to the leading edge of each data, and the difference between the time up to the trailing edge of the reference clock and the time up to the trailing edge of each data are respectively obtained from the measured time. The propriety is determined on the basis of whether each time difference is in the standard range.