发明名称 ELIMINATION GAS ANALYSIS APPARATUS AND METHOD
摘要 PROBLEM TO BE SOLVED: To solve the problems that natural cooling of temperature of a sample stage 106 approximately to a room temperature needed to be waited for to start the next analysis from approximately a room temperature in the conventional elimination gas analysis apparatus, natural cooling of the sample stage 106 took time, and time spent for analysis including the loading/unloading of a sample was large when performing analysis continuously using a plurality of samples, and thermal stress may be applied when rapid temperature change is given in the sample stage 106 made of quartz for leading to one of factors for spending much time for analysis. SOLUTION: In temperature increase elimination gas analysis, a temperature control mechanism is brought into contact with the sample stage 106 in a vacuum chamber 101 to allow samples to be exchanged quickly without applying thermal stress to the sample stage 106 and to reduce time to be spent for analysis.
申请公布号 JP2002372483(A) 申请公布日期 2002.12.26
申请号 JP20010187497 申请日期 2001.06.21
申请人 TOSHIBA MICROELECTRONICS CORP;TOSHIBA CORP 发明人 TANAKA KAZUHIRO
分类号 G01N25/14;G01N1/00;G01N1/22;G01N1/28;G01N27/62;(IPC1-7):G01N1/22 主分类号 G01N25/14
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