发明名称 Methods of fabricating read only memory devices including thermally oxidized transistor sidewalls, and devices so fabricated
摘要 A ROM device is fabricated by forming a first conductive layer pattern including a sidewall, on an insulating layer on an integrated circuit substrate. Ions are implanted into the integrated circuit substrate using the first conductive layer pattern as an implantation mask. At least a portion of the integrated circuit substrate, and at least a portion of the sidewall are thermally oxidized, to form a thermal oxide layer on at least a portion of the integrated circuit substrate and on the sidewall, and to form a buried doping layer from the implanted ions beneath the thermal oxide layer. A second conductive layer pattern is then formed on at least a portion of the thermal oxide layer and on at least a portion of the first conductive layer pattern.
申请公布号 US2002197799(A1) 申请公布日期 2002.12.26
申请号 US20020085369 申请日期 2002.02.28
申请人 LEE HEE-JUENG;YOON KI-CHANG 发明人 LEE HEE-JUENG;YOON KI-CHANG
分类号 H01L21/28;H01L21/336;H01L21/8246;(IPC1-7):H01L21/336 主分类号 H01L21/28
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