发明名称 DROP SHOCK-TESTING APPARATUS
摘要 PROBLEM TO BE SOLVED: To provide a drop shock-testing apparatus for constantly maintaining the drop attitude of an object to be tested and at the same time allowing the object to collide with a collision surface in a state close to free drop. SOLUTION: A vacuum pump 3 is driven, the inside of a tube A 21 is evacuated via a solenoid valve A 5 for sucking the object 4 to be tested at the tip of a test object suction pad 1, and the inside of a tube B 22 is evacuated via a solenoid valve B 6 for sucking a hand 14 to the tip of the suction pad 2. Turning on a switch A 8 and closing the solenoid valve B 6 release the hand 1 that has sucked the object 4 to be tested from a hand suction pad 2 for falling by an interval J along a linear rail 11. The hand 14 turns on the switch B 9, an electric signal is transferred through a signal line C 19, a control section 7, and a signal line D 20 for closing the solenoid valve A 5 of the vacuum pump 3, thus allowing the object 4 to be tested to collide with a collision support plate 15 after having been released from the hand 14.
申请公布号 JP2002372485(A) 申请公布日期 2002.12.26
申请号 JP20010179667 申请日期 2001.06.14
申请人 NEC CORP 发明人 HIRATA ICHIRO
分类号 G01N3/303;(IPC1-7):G01N3/303 主分类号 G01N3/303
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