发明名称 METHOD AND APPARATUS FOR FLATTENING INTERLAYER/ INTRALAYER INSULATING FILM
摘要 PROBLEM TO BE SOLVED: To provide a method and an apparatus for inexpensively flattening an interlayer/intralayer insulating film on a semiconductor wafer with a large throughput and simple processes. SOLUTION: To flatten an interlayer/interalayer insulating film on a semiconductor wafer (14), a method and an apparatus (10 and 50) are provided. The method includes a step for providing a furnace (12) having a wafer holder (26) at the inside, a step for arranging the semiconductor wafer (14) on the wafer holder (26), and a step for simultaneously applying mechanical pressure and heat to the interlayer/interalayer insulating film on the semiconductor wafer (14) by using apparatus (16 and 56).
申请公布号 JP2002373938(A) 申请公布日期 2002.12.26
申请号 JP20020116928 申请日期 2002.04.19
申请人 CHARTERED SEMICONDUCTOR MFG LTD 发明人 LEONG LUP SAN
分类号 H01L21/768;B24B1/00;B24B37/04;H01L21/302;H01L21/31;(IPC1-7):H01L21/768 主分类号 H01L21/768
代理机构 代理人
主权项
地址