发明名称 Thermal processing unit for single substrate
摘要 A thermal processing unit for a single substrate of the invention includes a processing chamber vessel whose inside can be made a predetermined atmosphere of a process gas, and an elevating shaft which can be moved up and down in the processing chamber vessel. A supporting body which can support a substrate is arranged on an upper end of the elevating shaft. The substrate supported by the supporting body is adapted to be heated by a heater. The supporting body has a circular supporting part which can support a substantially full surface of a peripheral area of the substrate, and a pushing-up member which can push up the substrate from on the supporting part for conveying the substrate. According to the invention, concentration of stress onto the substrate can be restrained, and a thermal process can be conducted uniformly within a surface of the substrate because heating from a peripheral area of the substrate may be restrained. In addition, the substrate can be easily conveyed although the substantially full surface of the peripheral area of the substrate is supported.
申请公布号 US6497767(B1) 申请公布日期 2002.12.24
申请号 US20000570571 申请日期 2000.05.12
申请人 TOKYO ELECTRON LIMITED 发明人 OKASE WATARU;YAGI YASUSHI
分类号 H01L21/22;C23C16/458;C23C16/46;C30B25/12;C30B31/14;H01L21/00;H01L21/205;H01L21/26;H01L21/324;H01L21/687;(IPC1-7):C23C16/00 主分类号 H01L21/22
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