发明名称 TWO-SURFACE MACHINING METHOD FOR WAFER AND ITS DEVICE
摘要 PROBLEM TO BE SOLVED: To provide a two-surface machining method for a wafer and its device capable of improving machining accuracy of a large diameter wafer. SOLUTION: A pair of surface plates 15 and 16 having a diameter smaller than the wafer W are oppositely arranged on both the obverse and reverse of the wafer W, and while sandwiching both sides of the wafer W rotatably supported by a wafer holding mechanism 17 by the surface plates 15 and 16, the surface plates 15 and 16 are rotated (an arrow K) in the circumferential direction, and the wafer W is simultaneously machined on both surfaces. At this time, the wafer W is vertically reciprocated (an arrow B) relative to the surface plates 15 and 16.
申请公布号 JP2002370161(A) 申请公布日期 2002.12.24
申请号 JP20010183358 申请日期 2001.06.18
申请人 MITSUBISHI MATERIALS CORP 发明人 OGATA YASUYUKI;SUDA NOBUO;TANAKA HIROSHI;KONGOJI TOYOHISA
分类号 B24B7/17;B24B37/08;H01L21/304 主分类号 B24B7/17
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