发明名称 |
TWO-SURFACE MACHINING METHOD FOR WAFER AND ITS DEVICE |
摘要 |
PROBLEM TO BE SOLVED: To provide a two-surface machining method for a wafer and its device capable of improving machining accuracy of a large diameter wafer. SOLUTION: A pair of surface plates 15 and 16 having a diameter smaller than the wafer W are oppositely arranged on both the obverse and reverse of the wafer W, and while sandwiching both sides of the wafer W rotatably supported by a wafer holding mechanism 17 by the surface plates 15 and 16, the surface plates 15 and 16 are rotated (an arrow K) in the circumferential direction, and the wafer W is simultaneously machined on both surfaces. At this time, the wafer W is vertically reciprocated (an arrow B) relative to the surface plates 15 and 16. |
申请公布号 |
JP2002370161(A) |
申请公布日期 |
2002.12.24 |
申请号 |
JP20010183358 |
申请日期 |
2001.06.18 |
申请人 |
MITSUBISHI MATERIALS CORP |
发明人 |
OGATA YASUYUKI;SUDA NOBUO;TANAKA HIROSHI;KONGOJI TOYOHISA |
分类号 |
B24B7/17;B24B37/08;H01L21/304 |
主分类号 |
B24B7/17 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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