| 摘要 |
First, in the step of analyzing integrated circuit information, integrated circuit information is retrieved and the structure of the circuit is analyzed, thereby creating routing information for each functional block. Next, in the step of analyzing pin allocation information, pin allocation information, including input and output pin connection information for the functional block, is retrieved and the contents thereof are analyzed, thereby creating machine-readable pin combination information. The input pin connection information represents which input pin of the functional block should be connected to each external test data input pin. The output pin connection information represents which output pin of the functional block should be connected to each external test data output pin. Then, in the step of outputting testable integrated circuit information, information about a test data input or output circuit is added to the routing information, which has been analyzed in the step of analyzing integrated circuit information, based on the pin combination information, thereby outputting testable integrated circuit information.
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